At INL - International Iberian Nanotechnology Laboratory you have access to various combinations of research systems of the latest generation. This course offers you the opportunity of learning (theory and practice) with the most modern systems. This is the best way of learning the more about Electron Microscopy.
JEOL JEM 2100 (TEM)
Jeol JEM 2100 is a (Scanning) Transmission Electron Microscope, 80 – 200 kV LaB6 gun, equipped with TEM, STEM (Bright and Dark Field) and EDS modes. It has a 4K x 4K camera (OneView – 16 Megapixels) that reaches 25 fps at a full 4K x 4K resolution. Its high specimen tilt holder for electron tomography allows a tilting angle range of ±40°. Jeol JEM 2100 reaches a point resolution of 0.23 nm at 200 kV.
FEI Helios NanoLab 450S DualBeam - FIB with Ultra High Resolution FEG-SEM
FEI Helios 450S is a workstation combining Scanning Electron Microscope and Focused Ion Beam for nanoprototyping, nano-machining, nano-analysis and advanced sample preparation (TEM lamellas, cross-section analysis, slice and view…). Simultaneously images are achieved with the electron beam at ultra-high resolution using a Schottky field emitter while, at the same time, patterning with the ion beam using a liquid Gallium ion emitter.
FEI Quanta 650 FEG Environmental SEM
The Quanta 650 FEG (FEI) is a field emission Scanning Electron Microscope capable of generating and collecting all available information from any type of sample material: it is the most versatile high-resolution low-vacuum FEG-SEM with extended low-vacuum capabilities for really challenging samples and for dynamic experiments. The Quanta 650 FEG can freely and simply be switched between three vacuum modes, which enables the investigation of conductive, non-conductive and high-vacuum incompatible materials: High-vacuum mode (<6·10-4 Pa) for imaging and microanalysis of conductive and/or conventionally prepared specimens; Low-vacuum mode (10 to 130 Pa) for imaging and microanalysis of non-conductive specimens without preparation; and ESEM mode (130 to 2600 Pa) for high-vacuum incompatible specimens which are impossible to investigate with traditional electron microscopy methods and for dynamic experiments.