For many centuries, humans have used instruments to surpass the resolution of the human eye. From reading stones to telescopes, optical microscopes and more recently to electron microscopes.
Currently, with the interest in nanoscale materials and clean energy technologies, sophisticated high-resolution scanning/transmission electron microscopes are critical, because of their unique ability to provide imaging, diffraction and spectroscopic information at the nano/atomic scale.
In this context, the goal of this course is to develop a basic understanding of the principles, operation and techniques of scanning/transmission electron microscopy. The methods are complex and under constant development, so in depth, advanced training for new users is essential to ensure future users can adapt new technologies to expand into new areas and solve new problems. This course provides the theoretical and practical training and aims to provide you with meaningful and relevant imaging and diffraction data.
The course is aimed at PhD-Students and PostDocs who wish to learn and develop a basic understanding of the principles, operation and techniques of scanning/transmission electron microscopy.
- Types of Microscopes, Electron Guns, Lens, Apertures, Lens Aberrations | Day 1
- Electron - Specimen Interactions & Design of TEM|Detectors and Holders/Sample Preparation | Day 2
- SEM|FIB - Dual Beam & Theory of Diffraction | Day 3
- Interpreting Diffraction Patterns & Imaging: Types of Contrast | Day 4
- Diffraction Contrast & Phase Contrast/Aberration-Corrected TEM | Day 5
After this course, students should be able to understand the foundations of scanning/transmission electron microscope and be able to apply these techniques to their own research projects.
There will be 'hands-on' sessions during the afternoons - from Monday to Friday - in the following instruments:
- JEOL JEM 2100 (TEM)
- FEI Helios NanoLab 450s DualBeam - FIB with Ultra High Resolution FEG-SEM
- FEI Quanta 650 FEG Environmental SEM
The Language course will be English.
Participants are accepted on a 'first-come, first served' basis, therefore we recommend that you fill in your registration at your earliest convenience.
- Transmission Electron Microscopy: A Textbook for Materials Science(4-Vol Set) by David B. Williams and C. Barry Carter;
- Scanning Electron Microscopy and X-Ray Microanalysis by Dale E. Newbury, Patrick echlin, David C. Joy, Charles E Lyman, Eric Lifshin, Lynda Sawyer, and Joseph R. Michael.